The workshop provides an open framework for exchanging ideas especially on the best practices around recently released test standards IEEE 1149.1-2013 and IEEE 1687-2014, as well as IEEE 1500-2005.  

Reports on first-time usage of these new standards are welcome as is research exploring the best usage of features defined in these standards. Valuable contributions describe lessons-learned, what works, what doesn’t, or how the standards were incorporated into existing or new DFT methodologies. Also of interest is how these standards interact with each other, or with related standards like the upcoming IEEE P1838.