活动简介

The 2016 Accelerated Stress Testing and Reliability (ASTR) Conference is focused on highlighting cutting-edge methods to deliver maximum cost-benefits from reliability testing. ASTR 2016 is relevant to manufacturers in the aerospace, automotive, consumer electronics, defense, medical, telecommunications and other industries where reliability is a key driver of operational and business success. If your company needs to improve product testing with a goal to improve reliability, reduce warranty costs, improve profits, gain market share, and be more competitive, then the 2016 ASTR Conference is for you.  

Accelerated stress testing is a key tool within a well-structured development program, being able to focus timely opportunities for product improvement and being able to deliver assured product performance. This year's workshop will deliver detailed case studies, best practices, lessons learned and clear insight designed.

征稿信息

重要日期

2016-03-15
摘要截稿日期
2016-05-15
初稿截稿日期
2016-05-31
初稿录用日期
2016-06-15
终稿截稿日期

征稿范围

  • Accelerated testing

  • degradation methods

  • effective test

  • HALT and field reliability

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重要日期
  • 会议日期

    09月28日

    2016

    09月30日

    2016

  • 03月15日 2016

    摘要截稿日期

  • 05月15日 2016

    初稿截稿日期

  • 05月31日 2016

    初稿录用通知日期

  • 06月15日 2016

    终稿截稿日期

  • 09月30日 2016

    注册截止日期

主办单位
IEEE
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