IEEE Topical Meetings on Silicon Monolithic Integrated Circuits in RF Systems have been at the forefront of moving Silicon technologies into microwave and millimeter-wave applications – a development now widely accepted, and of great importance. RF CMOS and Si/SiGe BiCMOS technologies are well established in commercial and increasingly also military applications. Invited tutorial talks from international experts will be presented in key topical areas. A student paper competition will be held, and prizes will be given at the conference banquet.
SiRF is part of the IEEE Radio Wireless Week (RWW), which also includes the Radio and Wireless Symposium (RWS) and the IEEE Topical Conferences on Wireless Sensors and Sensor Networks (WiSNet), Biomedical Radio and Wireless Technologies, Networks, and Sensing Systems (BioWireleSS), and Power Amplifiers for Wireless and Radio Applications (PAWR).
We will continue posting updates and information about the conference on this website. Make sure you visit this website frequently to keep track with the latest news about SiRF 2016!
We solicit technical papers in the following and similar fields of research:
● Materials: Epitaxy, strain engineering, characterization, stability issues, smart materials.
● Technologies: Nano-technologies incl. CNT, nanowire and graphene; Si-based heterostructures, advanced RF CMOS and Si/SiGe BiCMOS incl. through-Si vias integration; RFMEMS and micromachining for improved RF performance and integrated antennas, RFMEMS/RFIC integration; advanced packaging.
● Devices: Physics, optimization, and scaling limits of SiGe HBTs, RF CMOS, strained-Si CMOS, Si-Ge MOSFETs and MODFETs, mm-wave diodes; advanced passive devices, integrated antennas; nanodevices for micro-/millimeter-wave applications.
● Circuits: Microwave, mm-wave, THz and mixed signal building blocks and multi-functional ICs, integrated transceivers, high-speed DAC and ADC, RFICs, reconfigurable micro-/mm-wave ICs.
● Si photonics: Si-based photonic components, integration with electronic circuits.
● Applications: System-on-Chip (SoC) and System-in-Package (SiP), Flexible electronics; 2-D electronics; ultra-wideband (UWB) frontends, wireless sensor networks, intelligent antennas and antenna rray solutions, emerging telecom (e.g. 60 GHz WLAN, E-band) and sensor systems (automotive,
security, health monitoring); radio over fiber.
● Yield, Reliability and Signal Integrity: Yield impact of nanoscaling and heterogeneous integration;robustness and reliability of ultra-scaled technologies; substrate noise, on-chip crosstalk; thermal
management.
● Measurement and Modeling: Multi-physics modeling, EM simulation of complex RFICs, robustmeasurement and de-embedding, built-in self-test, self-calibration, high-throughput RFIC testing.
01月24日
2016
01月27日
2016
注册截止日期
2017年01月15日 美国 Phoenix,USA
2017年IEEE RF系统硅单片集成电路专题会议
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