活动简介

CMI 2016 will be the first biennial flagship event of IEEE Joint CSS-IMS Chapter, Kolkata Section, India. This event will provide a global forum for academicians, researchers, industrial practitioners, scientists and engineers to discuss about their research endeavors, studies, findings, new ideas and concepts, contributions and developments related to the areas of control theories and applications, measurement theories and applications and instrumentation theories and applications. CMI 2016 will comprise keynote and plenary sessions by eminent academicians, regular and poster sessions of contributed papers, special sessions and tutorial sessions. All papers will undergo blind peer review process and the criteria for acceptance will be based on quality, originality, technical content and relevance.

征稿信息

征稿范围

The topics will include but are not limited to:

  1. Advances in Theoretical Aspects of Control, Measurement and Instrumentation (CMI)
  2. Sensors, Transducers and Actuators
  3. Sensor Fusion and Sensor Arrays
  4. Robotics, Mechatronics and Electromechanical Systems
  5. Smart Sensors and Computational Instrumentation
  6. Sensor Networks and Internet of Things
  7. Signal and Image Processing in Control, Measurement and Instrumentation
  8. Vision Sensing Based Systems
  9. VLSI,Micro and Nanotechnology in CMI
  10. Biomedical Sensors, Signal Analysis and Health Monitoring Applications
  11. Data Acquisition Systems and Methodologies
  12. Virtual Measurement and Instrumentation
  13. Application of CMI Techniques in Wireless Communication Systems
  14. Application of CMI Techniques in Power Electronics and Drives
  15. Power System Measurement and Control
  16. Adaptive and Intelligent Control
  17. Nonlinear Systems and Control
  18. Process Control and Instrumentation
  19. Networked and Distributed Control
  20. Optimal and Robust Control
  21. Control and Automation
  22. Estimation, Modeling and Identification
  23. Real time Systems and Embedded Systems
  24. Multi Agent Systems
  25. Fuzzy, Neural  and Optimization Techniques in Control, Measurement and Instrumentation
  26. Instrumentation for Condition Monitoring
  27. Applications of Control, Measurement and Instrumentation (Electrical, Power and Energy, Electronic, Mechanical, Communication, Metallurgical, Chemical, Automotive, Aerospace, Vehicular, Manufacturing, Medical etc.
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重要日期
  • 会议日期

    01月08日

    2016

    01月10日

    2016

  • 01月10日 2016

    注册截止日期

主办单位
IEEE Instrumentation and Measurement Society
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