活动简介
Semiconductor Wafer Test Workshop is the only IEEE Components, Packaging, Manufacturing Technology (CPMT) Society event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has a mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. There is a relaxed atmosphere with social activities and plenty of time for informal discussion and networking. The two and one half-day event starts Sunday afternoon with registration, a reception, a buffet dinner, and a panel discussion. The conference adjourns on Wednesday at noon, in time to get most participants back to work by Thursday morning. SWTW has grown to almost 500 attendees with more international visitors each year.
征稿信息

征稿范围

Our Program Committee has not decided on the major themes, however, we are actively soliciting presentations for many "hot topics" that include (but are not limited to) ... · New probe card and contactor technologies · Practices and c
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重要日期
  • 会议日期

    06月08日

    2014

    06月11日

    2014

  • 06月11日 2014

    注册截止日期

主办单位
IEEE Components, Packaging and Manufacturing Technology Society
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