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The Scanning Microscopies 2014 meeting brings microscopists from all aspects of scanning microscopies (from scanned optics and probes to scanned particle beams) together in a single forum to discuss current research and new advancements in the field. Previous SCANNING meetings have had a large Forensics and Food Technology following. The various scanned microscopies are also key investigative and research tools in micro and nanotechnology. In an effort to promote the scientific dissemination of undergraduate research findings, Scanning Microscopies is making a special call for undergraduate research abstracts. Contributions are accepted as either oral or poster presentations; with the option of publication in the regular conference proceedings volume. All contributions resulting are welcome.
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重要日期

2014-04-14
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Papers are encouraged from all areas of scanning microscopies; optical, particle beam (ion and electron), and scanned probe especially those in new growth areas. For example (but not restricted to): photomask imaging, metrology and characterization nanoma
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重要日期
  • 会议日期

    09月16日

    2014

    09月18日

    2014

  • 04月14日 2014

    摘要截稿日期

  • 09月18日 2014

    注册截止日期

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