This Conference will bring together the theory, modeling, measurement and applications for the reflection, scattering and diffraction of electromagnetic waves from the far ultraviolet through the far infrared. It also includes the topic of stray light in optical systems: stray light research, analysis, and component or system level measurements for all types of optical systems. This meeting provides a forum for researchers, scientists, engineers, and systems designers to present recent results dealing with reflection, rough surface scattering, diffraction, and stray light for related applications.