With the aggressive scaling of advanced IC technologies, today’s analog and mixed-signal (AMS) circuits have become extremely complex. As circuit designers have adopted a number of non-traditional methodologies (e.g., multi-mode operation, adaptive self-healing, etc) to address the design challenges associated with technology scaling (e.g., reduced voltage headroom, increased process variation, etc), the corresponding digital-analog interactions have become increasingly difficult to verify. These recent trends of AMS circuits have brought up enormous new challenges and opportunities for AMS CAD. The purpose of this workshop is to report recent advances on AMS CAD and, more importantly, motivate new research topics and directions in this area. Topics of interest include (but not limited to): Behavioral and performance modeling at both circuit and system levels AMS simulation and verification AMS post-silicon validation and self-healing AMS circuit optimization and design space exploration PVT variations and reliability for AMS circuits AMS testing and diagnosis