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The Future of Instrumentation International Conference (FIIC) 2013 will provide a forum for research scientists, engineers, and practitioners throughout the world to present their latest research findings, ideas, and applications in the area of advanced instrumentation and associated technology. FIIC 2013 will include keynote addresses and invited presentations by eminent scientists. Past Workshops on the Future of Instrumentation have focused on trends associated with communications, circuit intricacies, and applications of advanced instrumentation. Tracking both the roadmaps of instrumentation development and the analyses of the instrumentation market(s) generated during those meetings has shown a highly accurate prediction of where “future instruments” are heading – both as R&D efforts and commercialization of advanced technologies.
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FIIC 2013 will continue to investigate the trend analysis of where future instruments are headed in terms of both technology and market, as well as focusing the program on areas such as: · The role of intrinsically safe, very inexpensive instrum
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重要日期
  • 会议日期

    10月07日

    2013

    10月09日

    2013

  • 10月09日 2013

    注册截止日期

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IEEE Instrumentation and Measurement Society
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