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The main focus of S&D4RCES is on the topic of making security and dependability expert knowledge available to Resource Constrained Embedded Systems (RCES) engineering processes. Special emphasis will be devoted to promote discussion and interaction between researchers and practitioners focused on the particularly challenging task to efficiently integrate security and dependability solutions within the restricted available design space for RCES. Furthermore, one important focus is on the potential benefits of the combination of model-driven engineering with pattern-based representation of security and dependability solutions. The workshop aims to bring together researchers from various fields involved in the development and deployment of RCES with a particular focus on the transfer of results from fundamental research to the industrial development of RCES.We believe that the synergy between researchers working in different aspects of this area will produce important benefits. The objective of this workshop is to foster an exchange of ideas among practitioners, researchers and industry involved in the deployment of secure and dependable resource-constrained embedded systems. The exchange of concepts, prototypes, research ideas, and other results which contribute to the academic arena and also benefit business and industrial communities, is of particular interest. Some of the topics that we seek to include in the workshop are related to the development of models and tools to support the inclusion of security and dependability (SD) issues into the RCES engineering process. The workshop aims to bring together researchers from various fields involved in the development and deployment of RCES, with a particular focus on the transfer of results from fundamental research in model-based development and in re-usale security and dependability solutions to the industrial development of RCES. Thus, the workshops beyond the existing MODELS participants also targets audience from communities concentrated on security and dependability. We believe that synergy between researchers working in different aspects of this area will produce important benefits.
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Topics of interest include, but are not limited to: Design process of S&D patterns Model-based repository of S&D patterns for RCES Formalization of S&D properties at the pattern level Verification, testing and validation of S&D by design i
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重要日期
  • 会议日期

    06月18日

    2013

    06月21日

    2013

  • 06月21日 2013

    注册截止日期

主办单位
美国计算机学会
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