The ICMIE conference is the premier interdisciplinary platform for the presentation of new advances and research results in the fields of Measurement Instrumentation and Electronics. The conference will bring together leading academic scientists, researchers and scholars in the domain of interest from around the world.

Topics of interest for submission include, but are not limited to:

Topics | Flyer

I. Instrumentation and Measurement Systems

• Electronic instruments and measurement systems
  Optical instruments and measurement systems
  MEMS instruments and test systems
  Precision instruments and measurement systems
  Scientific experiment and analytic instruments
  Testability and built-in-test
  Virtual instruments
  VLSI testing and fault diagnosis

  II. Data Acquisition and Analysis

• Cyber-physical systems
  Data acquisition systems and technology
  Image processing
  Internet of Things (IoT)
  Machine learning and pattern recognition
  Massive data management and analysis
  Measurement error theory
  Measurement systems and theory
  Networks in test and measurement
  Non-electric measurement
  Reconfigurable computing and sensor fusion
  Sensor networks
  Sensors and transducers
  Signal analysis and processing
  Signal transmission and data bus
  Virtual measurement

  III. Electronics and Applications

• Biomedical electronics
  Communication theory and systems
  Control theory and applications
  Electrical machines and drives
  Electrical materials and electromagnetics
  Electronics instrumentation
  High voltage techniques and microwave
  Intelligent systems and sensors
  Mechatronics
  Multi-robot systems
  Optoelectronics
  Power electronics and applications
  Robotics and automation systems