AboutAerospace; Components, Circuits, Devices and Systems; Computing and Processing; General Topics for Engineers; Signal Processing and Analysis
Keywords:Design for Testability,Built-in self-test,On-Line Testing,Functional Testing,Radiation Hardening Techniques,Memory Testing,Fault Tolerance Approaches,Hardware Security and Trust,Design for Robustness,Design for Security,Dependable Computer Architectures,Variability in Nanometer Technologies,Reliability Assessment ,Test and Reliability of Emerging Technologies,
Scope:The IEEE Latin American Test Symposium (LATS) is a recognised forum for professionals, from all over the world, in particular from Latin America, to present and discuss aspects related to test and reliability of integrated systems. In more detail, academia and industry are invited to share their experience in the context of device and system testing as well as fault tolerance strategies for CMOS- and emerging technology-based applications. Presented papers are also published in the IEEEE Xplore Digital Library as well as the best papers of LATS are also invited to be re-submitted to IEEE Design & Test of Computers, IEEE Transactions on Computer-Aided Design and Journal of Electronic Testing: Theory and Applications.
Sponsor Type:1; 9