活动简介

Welcome to the 19th Annual IEEE Workshop on Microelectronics and Electron Devices (WMED 2022). WMED is a technical forum for reviewing and discussing all aspects of micro- and nano-electronics including processing, electrical characterization and reliability, design, and new device technologies. This workshop will consist of invited talks, contributed papers, and a poster session throughout the day. Faculty, students, and researchers in industry are encouraged to contribute presentations on either completed research or work-in-progress.

征稿信息

重要日期

2022-03-25
终稿截稿日期

WMED offers a unique opportunity in the Treasure Valley for developing a wide range of professional relationships. The keynote talk invited lectures, and social events provide an opportunity to interact with the leaders and innovators in your field of interest. Topics in the following areas will form the contributing sessions and poster session in the workshop:

征稿范围

1.  Microelectronic Device Processing and Process Integration
 Trends in submicron CMOS technology, product development (DRAM, SRAM, Flash, CMOS Imagers), new device technologies (phase-change memory, resistive memory, ferroelectric memory), novel transistors.

2. Nanoelectronic Devices and MEMS 
 Novel processes, materials and device characterization on nanotubes, nanowires, quantum dots, molecular devices, MEMS research.

3. Microelectronic Device Electrical and Reliability Testing 

 Dielectric reliability, device reliability, novel memory technology testing schemes.

4. Semiconductor Packaging and Reliability
 Semiconductor package reliability, design for manufacturability, stacked die packaging and novel assembly processes.

5. Microelectronic Circuit and System Design
 New product design, high-speed and low-power design techniques and system architectures and memory sensing schemes.

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重要日期
  • 04月08日

    2022

    会议日期

  • 03月25日 2022

    终稿截稿日期

  • 04月08日 2022

    注册截止日期

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