活动简介

The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind.

Sponsor Type:1; 1; 9

组委会

General Chair

Jin-Fu Li
National Central University

Program Chair

Jing-Jia Liou
National Tsing Hua University

Tutorial Chair

Hung-Pin Wen
National Yang Ming Chiao Tung University

Publicity Chair

Shyue-Kung Lu
National Taiwan University of Science and Technology

Web Chair

Chih-Tsun Huang
National Tsing Hua University

Finance Chair

Tong-Yu Hsieh
National Sun Yan-Set University

Publication Chair

Tsung-Chu Huang
National Changhua University of Education

Local Arrangement Chair

Meng-Lieh Sheu
National Chi Nan University

征稿信息

重要日期

2022-06-03
摘要截稿日期
2022-08-05
初稿录用日期

征稿范围

Topics of interest include (but are not limited to):

• Analog/Mixed-Signal/RF Test
• ATPG and Fault Simulation
• Design for Testability
• Design and Test for Reliability
• Design and Test for Functional Safety
• System-level Test
• Test for Memory Systems
• Test and Validation for Processors
• Test for Packaging and 3D IC
• Test for IoT Device and System
• Test for Emerging Technologies
• Machine Learning and Test AI
• Hardware-Oriented Security and Trust
• Test Standards
• Test Quality and Economic
• Validation and Verification
• Diagnosis and Silicon Debug
• Wafer-level Tests
• Failure Analysis
• Yield Analysis and Enhancement

留言
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重要日期
  • 会议日期

    11月21日

    2022

    11月24日

    2022

  • 06月03日 2022

    摘要截稿日期

  • 08月05日 2022

    初稿录用通知日期

  • 11月24日 2022

    注册截止日期

主办单位
IEEE Computer Society
IEEE Council on Electronic Design Automation
National Tsing Hua University
历届会议
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