活动简介

Microelectronics Design and Test Symposium (MDTS, formerly known as North Atlantic Test Workshop) will have its 30th annual meeting (virtual) from Albany-NY on May 18th – 21st, 2021.

Sponsor Type:2; 3

组委会

Operation Committee

Eugene Atwood – IBM
Kelly Okunzzi – Marvell Semi
Danella Zhao – Old Dominion Univ.
Malinky Ghosh – IBM
Andy Laidler – ON Semi 
Ryan Patterson – CACI
Carl Wisnesky – Cadence
Krishna Chakravadhanula – Cadence
Yu Zhang – Aptiv
Charles Thangaraj – Roger Williams Univ.
Themistoklis Haniotakis – S. Illinois Univ.
Patrick Girad – LIRMM, France

Technical Program Committee

Dave Armstrong – Advantest
R.Iris Bahar – Brown Univ.
Michael Brown – Mentor Graphics               
Hari Chauhan – Analog Devices             
Fen Guan – Global Foundries
Ujjwal Guin – Auburn Univ.
Ian Harris – UC Irvine
Michael Hsiao ­– Virginia Tech.
Yu Huang – HiSilicon
Naghmeh Karimi – Univ. Maryland             
Sandip Kundu – NSF/UMASS Amherst
Qing Lin – Broadcom
JienChung Lo – U. Rhode Island
Xijiang Lin – Mentor Graphics
James Lloyd – SUNY PolyTech
Michail Maniatakos – NYU                    
Zainalabedin Navabi – WPI
Nicola Nicolici – McMaster Univ.
Sudhakar Reddy – University of Iowa
Jeffrey Roehr – Test Consultant
Virendra Singh – IIT – Bombay
Rahul Singhal – Mentor Graphics
Mustapha Slamani – Global Foundries
Uma Srinivasan – IBM Corp.
John Suarez – Widener Univ.
Haralampos G. Stratigopoulos, CNRS
Mike Tehranipoor – U. of Florida
Ramesh Tekumalla – Avago Tech
Andres Veneris – U. of Toronto           
Xingguo Xiong – U. of Bridgeport
Qiaoyan Yu – Univ. of New Hampshire
Zeljko Zilic – McGill Univ.

Steering Committee

Vishwani Agrawal – Auburn Univ.
Xinghao Chen – IEEE
Ted Cooley
Jennifer Dworak – Southern Methodist Univ.
Brion Keller – Lockheed Martin
Martin Margala – UMass Lowell
Colin McDonough – IEEE
Karen Panetta – Tufts Univ.
Paul Reuter – Mentor Graphics
Charles Rubenstein – IEEE
Peilin Song – IBM
Tian Xia – U. of Vermont

征稿信息

重要日期

2021-03-30
初稿截稿日期
2021-04-20
初稿录用日期

征稿范围

Topics of Interest include but are not limited to:

Micro Devices, Circuits and Microsystems

Biomedical, Photonics, and Quantum Electronics

Electronic Design & Test Methodologies and EDA

Design verification/validation; Machine learning for testing Hardware Security

Emerging Technologies and Applications
 

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重要日期
  • 会议日期

    05月18日

    2021

    05月21日

    2021

  • 03月30日 2021

    初稿截稿日期

  • 04月20日 2021

    初稿录用通知日期

  • 05月21日 2021

    注册截止日期

主办单位
Region 01- Northeastern USA Schenectady Section
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