Microelectronics Design and Test Symposium (MDTS, formerly known as North Atlantic Test Workshop) will have its 30th annual meeting (virtual) from Albany-NY on May 18th – 21st, 2021.
Sponsor Type:2; 3
Operation Committee
Eugene Atwood – IBM
Kelly Okunzzi – Marvell Semi
Danella Zhao – Old Dominion Univ.
Malinky Ghosh – IBM
Andy Laidler – ON Semi
Ryan Patterson – CACI
Carl Wisnesky – Cadence
Krishna Chakravadhanula – Cadence
Yu Zhang – Aptiv
Charles Thangaraj – Roger Williams Univ.
Themistoklis Haniotakis – S. Illinois Univ.
Patrick Girad – LIRMM, France
Technical Program Committee
Dave Armstrong – Advantest
R.Iris Bahar – Brown Univ.
Michael Brown – Mentor Graphics
Hari Chauhan – Analog Devices
Fen Guan – Global Foundries
Ujjwal Guin – Auburn Univ.
Ian Harris – UC Irvine
Michael Hsiao – Virginia Tech.
Yu Huang – HiSilicon
Naghmeh Karimi – Univ. Maryland
Sandip Kundu – NSF/UMASS Amherst
Qing Lin – Broadcom
JienChung Lo – U. Rhode Island
Xijiang Lin – Mentor Graphics
James Lloyd – SUNY PolyTech
Michail Maniatakos – NYU
Zainalabedin Navabi – WPI
Nicola Nicolici – McMaster Univ.
Sudhakar Reddy – University of Iowa
Jeffrey Roehr – Test Consultant
Virendra Singh – IIT – Bombay
Rahul Singhal – Mentor Graphics
Mustapha Slamani – Global Foundries
Uma Srinivasan – IBM Corp.
John Suarez – Widener Univ.
Haralampos G. Stratigopoulos, CNRS
Mike Tehranipoor – U. of Florida
Ramesh Tekumalla – Avago Tech
Andres Veneris – U. of Toronto
Xingguo Xiong – U. of Bridgeport
Qiaoyan Yu – Univ. of New Hampshire
Zeljko Zilic – McGill Univ.
Steering Committee
Vishwani Agrawal – Auburn Univ.
Xinghao Chen – IEEE
Ted Cooley
Jennifer Dworak – Southern Methodist Univ.
Brion Keller – Lockheed Martin
Martin Margala – UMass Lowell
Colin McDonough – IEEE
Karen Panetta – Tufts Univ.
Paul Reuter – Mentor Graphics
Charles Rubenstein – IEEE
Peilin Song – IBM
Tian Xia – U. of Vermont
Topics of Interest include but are not limited to:
Micro Devices, Circuits and Microsystems
Biomedical, Photonics, and Quantum Electronics
Electronic Design & Test Methodologies and EDA
Design verification/validation; Machine learning for testing Hardware Security
Emerging Technologies and Applications
05月18日
2021
05月21日
2021
初稿截稿日期
初稿录用通知日期
注册截止日期
2023年05月08日 美国 Albany
2023 IEEE 32nd Microelectronics Design & Test Symposium2022年05月23日 美国 Albany
2022 IEEE 31st Microelectronics Design & Test Symposium
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