The Reliability and Maintainability Symposium (RAMS) attracts leading Reliability and Maintainability experts from across industry, academia, and the U.S. Government. The topics addressed are broad, including R&M requirements, mission critical design and acquisition areas aimed at policies, technologies, lessons learned, modeling, simulation and training.
Sponsor Type:1; 9; 9; 9; 9; 9; 9; 9
General Chair
Sean Carter, NASA
Vice General Chair
Om Yadav, North Dakota State University
Treasurer
Charlie Plotkin, Ford Motor Company, Retired
Assistant Treasurer
Mike McKelvey, Boeing
Advanced Registration Consultant
Ken Dalton, Retired Reliability Engineer
Abstract topics are:
Accelerated Life Testing
Autonomous Systems and AI
Availability
Big Data and IoT Applications in R&M
Business Process Improvement
Design Optimization Using R&M Techniques
Diagnostics and Prognostics
Discrete Event Modeling & Simulation
Economic Models for R&M Equipment
FMEA
Fault Tolerance and Safety Critical Systems
Fault Tree Analysis
Human Reliability
Knowledge Based Training
Life Data Analysis
Maintenance Models and Methodologies
Physical Reliability Models
Prognostics and Health Management
Quality Appl. in Electronics Design & Mfg.
R&M Applications in Aerospace
R&M Applications in Health Care
R&M Applications in Infrastructure Management
R&M Applications in Manufacturing
R&M Applications in Service
R&M Applications in Supportability
R&M and Quality Appl. in Communications Design & Mfg.
R&M Management
Reliability Modeling
Reliability Growth Analysis
Repairable Systems
Risk Analysis and Management
Security and Dependability Analysis
Software Reliability and Testing
Software Safety
System Safety Analysis
Warranty Data Analysis and Management
05月24日
2021
05月27日
2021
摘要截稿日期
注册截止日期
2028年01月24日 美国 Houston
2028 Annual Reliability and Maintainability Symposium2019年01月28日 美国
2019 Annual Reliability and Maintainability Symposium2018年01月22日 美国 Reno,USA
2018 Annual Reliability and Maintainability Symposium2016年01月25日 美国
2016年可靠性与维修性年会2015年01月26日 美国
2015 Annual Reliability and Maintainability Symposium
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