3 / 2020-05-15 01:44:55
Testing of semiconductors using eagle tester
Integrated circuits
全文待审
Integrated Circuit (a packaged device) plays a major role in many applications such as military, spacecraft, automotive, medicine and consumer electronics. Testing of a packaged device is necessary before it reaches the end customer. Testing constraints also differs from applications to applications. Testing is done to check whether the measured IC parameters matches with the datasheet specification. Now a days testing of an IC is done using Automatic Test Equipment (ATE) instead of manual workbench. An ATE is a collection of high performance computer controlled test instruments. Testers consists of electronic devices that generates signals, establishes appropriate test patterns, properly set them in sequence and then use them to drive the semiconductor itself. The same tester can be used to check wide variety of devices reducing the overall impact of the capital investment required to utilize the tester. ATE provides result with more accuracy, reliability within a short time. A computer in tester controls the test hardware by executing a set of instructions called test program. Testers can be programmed to generate any type of signals. A number of signals together make up a test pattern or test vector. A test vector is applied to the device at a point in time. The outputs generated by the DUT are fed into instruments in the tester to measure their parameters. The results of the measurements are compared to the programmed values stored in the ATE. A device is considered functional if the measured parameters match the programmed values within acceptable tolerances. This paper includes testing of a serial in parallel out shift register
重要日期
  • 会议日期

    11月05日

    2020

    11月07日

    2020

  • 09月05日 2020

    初稿截稿日期

  • 10月07日 2020

    初稿录用通知日期

  • 11月07日 2020

    注册截止日期

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