Nagaraj Lakshmana Prabhu / Singapore University of Technology and Design (SUTD)
Desmond Loy Jia Jun / Nanyang Technological University (NTU)
Putu Andhita Dananjaya / Nanyang Technological University (NTU)
Eng Huat Toh / GLOBALFOUNDRIES Singapore Pte. Ltd.
Wen Siang Lew / Nanyang Technological University (NTU)
Nagarajan Raghavan / Singapore University of Technology and Design (SUTD)
In this work, the quantitative impact of variability in the low and high resistance state distributions of HfO2-based RRAM on the prediction accuracy of deep learning neural networks is explored over a wide range of current compliance ranging from 2 to 500µA. The device power versus prediction accuracy trade-off trend is examined for such a wide range of compliance for the first time. The weights of one of the layers of the convolutional neural network (CNN) are represented by the floating point binary representation where the binary bits are configured using the RRAM resistance distribution data on an AlexNet platform.