179 / 2019-06-27 20:14:03
Improve the performance of deep ultraviolet semiconductor lasers by optimizing the electron blocking layer
left-side cone EBL, electronic transmission, electron leakage
全文待审
QingGe Huo / National Center for International Joint Research of Electronic Materials and Systems
YuHuai Liu / National Center for International Joint Research of Electronic Materials and Systems
A method for improving the performance of deep ultraviolet laser devices by improving the electron blocking layer is proposed. It is applied to deep ultraviolet semiconductor laser diodes through the left tapered electron blocking layer (EBL). Compared to the right tapered electron blocking layer and the non-tapered electron blocking layer, the laser of left tapered electron blocking layer device exhibits higher efficiency at the time of installation, indicating a significant increase in electron transfer and holes, which improves the luminous efficiency of the device.
重要日期
  • 会议日期

    10月09日

    2019

    10月10日

    2019

  • 07月20日 2019

    初稿截稿日期

  • 10月10日 2019

    注册截止日期

主办单位
Xi’an Jiaotong University
历届会议
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