167 / 2019-06-19 19:33:31

Detecting Conductive Particles in TFT-LCD With U-MultiNet

conductive particles, deep convolutional network, automatic optical inspection, TFT-LCD

The conductivity of the TFT-LCD circuit can be
determined by counting and locating anisotropic conductive
film (ACF) particles in the circuit, which is a critical step for the
detection of conductivity in the TFT-LCD manufacturing
process. In order to solve the aggregation and overlap problems
of ACF particles, in this paper, we propose a U-shaped multiscale
convolution network(U-MultiNet). The U-Net network
structure is designed adaptively, which reduces the parameter
amount of the network. The multi-scale convolution blocks are
introduced for extracting the multiscale spatial features. In
addition, the particles detection is transformed into a
segmentation task, which helps to solve the aggregation and
overlap problems of particles. The experimental results show
that the method achieves high precision and recall rate, which is
far superior to the previous methods.