Materials and technologies - semiconductor and dielectric materials - quantum heterostructures - MS and MIS structures - nanostructures and nanotubes, low-dimensional structures - organic electronics Structures and devices - Si-based heterostructure devices - III-V and III-N heterostructure devices - quantum and resonance devices, microwave devices, nanodevices - lasers and photodetectors - power electronics Characterization, modelling and simulation - 2-D and 3-D process, structure and device simulation - heterostructure device modelling - structural, optical and electrical characterization of materials, structures and devices - reliability evaluation and modelling Sensors and microsystems - advanced concepts in lithography, plasma etching and deposition techniques - design and fabrication - surface and bulk micromachining - micro(nano)mechanical structures, micro(nano)electro-mechanical systems (MEMS, NEMS) - SMART Sensors - sensor characterization, modelling and simulation
10月21日
2018
10月24日
2018
初稿截稿日期
注册截止日期
2022年10月23日 斯洛伐克 Smolenice
2022 14th International Conference on Advanced Semiconductor Devices and Microsystems
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