Paul Sebastian Julienne  (JQI, NIST and University of Maryland)

Zheng-Tian Lu  (University of Science and Technology of China)

Jun Ye  (JILA, University of Colorado, Boulder and NIST)    

Hui Zhai  (Tsinghua University, China)

Peng Zhang  (Renmin University of China)

Invited Speakers

Matthew Dietrich,  Argonne National Laboratory,  USA 

Jose D'Incao,  JILA,  USA

Leonardo Fallani,  LENS,  Italy

Zhanjun Fang,  National Institute of Metrology,  China

Simon Fölling,  Ludwig-Maximilians-Universität,  Germany

Jeremy M Hutson,  Durham University,  UK

Gyu-Boong Jo,  The Hong Kong University of Science and Technology,  Hong Kong, China

Hidetoshi Katori,  Tokyo University,  Japan

Colin Kennedy,  JILA,  USA

Thomas Killian,  Rice University,  USA

Jerome Lodewyck,  SYRTE,  France

Andrew Ludlow,  NIST,  USA

Robert Lewis-Swam,  JILA,  USA

Marianna Safronova,  University of Delaware,  USA

Florian Schreck, University of Amsterdam,  Netherlands

Uwe Sterr, Physikalisch-Technische Bundesanstalt, Germany

Yoshiro Takahashi,  Kyoto University,  Japan

Jan Thomsen,  Niels Bohr Institute,  Denmark

Guglielmo Tino,  Univ of Florence,  Italy

Xinye Xu,  East China Normal University,  China

Tanya Zelevinsky,  Columbia University,  USA

Ren Zhang,  Xian Jiaotong University,  China