378 / 2018-03-31 01:01:12
An Ultra-Fast Short Circuit Protection Solution for E-mode GaN HEMTs
E-mode GaN HEMT,short circuit capability,short circuit protection,reliability
全文待审
He Li / The Ohio State University
Xintong Lyu / The Ohio State University
Ke Wang / The Ohio State University
Yousef Abdullah / The Ohio State University
Boxue Hu / The Ohio State University
Zhi Yang / The Ohio State University
Jin Wang / The Ohio State University
Liming Liu / ABB Corporate Research
Sandeep Bala / ABB Corporate Research
The Enhancement-mode (E-mode) Gallium Nitride High-Electron Mobility Transistor (GaN HEMT) has proven excellent electrical performance in various applications. Meantime, multiple comprehensive studies on the short circuit behavior show that GaN HEMTs has much shorter short circuit withstand time compared to conventional silicon (Si) devices. In this paper, the GaN HEMT short circuit capability is first introduced. Based on the testing results, the voltage dip on the phase-leg dc voltage under short circuit condition is proposed to be the short circuit detection signal, and the corresponding detection circuit and ultra-fast short circuit protection method is depicted. Finally, experimental results prove that with the proposed protection method, soft turn-off can be initiated within 200 ns with 400 V dc bus.
重要日期
  • 会议日期

    05月17日

    2018

    05月19日

    2018

  • 12月08日 2017

    摘要截稿日期

  • 01月30日 2018

    摘要录用通知日期

  • 02月10日 2018

    初稿截稿日期

  • 02月10日 2018

    终稿截稿日期

  • 05月19日 2018

    注册截止日期

主办单位
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
IEEE POWER ELECTRONIC SOCIETY
中国电源学会
中国半导体产业创新联盟
承办单位
西安交通大学
西安电子科技大学
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