374 / 2018-03-30 04:30:54
Novel GaN Power Transistor Substrate Connection to Minimize Common Mode Current
GaN-HEMT; substrate connection; dynamic ONstate resistance; inter-electrode capacitance; Common mode current; EMI
摘要待审
Ke LI / University of Nottingham
Paul Evans / University of Nottingham
Mark Johnson / University of Nottingham
Fast switching of GaN device would increase power converter common mode current Icm level. In this paper, it is proposed to connect substrate of the upper device in a halfbridge circuit to its drain terminal in order to decrease capacitive coupling between device switching node and ground plane so as to decrease Icm level. Device static and dynamic ON-state resistance and its inter-electrode capacitance are compared under different substrate connections, which shows that device static and dynamic characteristics do not noticeably degrade when connecting its substrate to drain terminal than conventional connection to its source terminal. Furthermore, Icm magnitude is reduced over the whole 150kHz to 30MHz conducted EMI frequency range, with 2dB-3dB reduced level between 150kHz to 3MHz and more than 5dB reduced level around 20MHz when device switches at 100V and 200V with switching frequency of 100kHz.
重要日期
  • 会议日期

    05月17日

    2018

    05月19日

    2018

  • 12月08日 2017

    摘要截稿日期

  • 01月30日 2018

    摘要录用通知日期

  • 02月10日 2018

    初稿截稿日期

  • 02月10日 2018

    终稿截稿日期

  • 05月19日 2018

    注册截止日期

主办单位
IEEE
IEEE ELECTRONIC DEVICE SOCIETY
IEEE POWER ELECTRONIC SOCIETY
中国电源学会
中国半导体产业创新联盟
承办单位
西安交通大学
西安电子科技大学
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