征稿已开启

查看我的稿件

注册已开启

查看我的门票

已截止
活动简介

Disruptive changes in learning and instruction through emerging technologies require new perspectives for the design and development of learning environments. Closely linked to the demand of new approaches for designing and developing learning environments is the necessity for enhancing the design and delivery of assessment systems and automated computer-based diagnostics. These systems need to accomplish specific requirements, such as adaptivity to different subject domains, flexibility for experimental and instructional settings, managing huge amounts of data, rapid and (near) real-time analysis of specific data, immediate feedback for learners, educators and learning designers, as well as generating automated reports of the diagnostics’ results. Further, sophisticated databases and network technologies contribute an especially wide variety of applications for technology-enhanced assessment. Hence, given the recent developments in educational data mining and learning analytics, technology-enhanced assessment may improve on-going learning through providing instant and rich feedback on the current stage of the learning process. This track aims to provide insights into the latest developments of research focusing on technology-enhanced assessment in formal and informal education.

征稿信息

征稿范围

Topics:

  • Linking learning analytics with technology-enhanced assessment

  • Design and development of technology-enhanced assessments for MOOCs

  • Automated assessment for personalized and adaptive learning environments

  • Using games and simulations for assessment in formal and informal education

  • Technology-enhanced assessment of 21st Century skills

  • Automated essay scoring

  • Digital Badges and microcredentials and their relation to assessment

  • Serious games analytics in formal and informal education

留言
验证码 看不清楚,更换一张
全部留言
重要日期
  • 会议日期

    07月03日

    2017

    07月07日

    2017

  • 07月07日 2017

    注册截止日期

主办单位
IEEE Computer Society
移动端
在手机上打开
小程序
打开微信小程序
客服
扫码或点此咨询