活动简介

The IEEE International Integrated Reliability Workshop (IIRW) originated from the Wafer Level Reliability Workshop in 1982. The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.

Tutorials, paper presentations, poster sessions, moderated discussion groups, special interest groups, and the informal format of the technical program provide a unique environment for understanding, developing, and sharing reliability technology and test methodologies for present and future semiconductor applications as well as ample opportunity for open discussions and interactions with colleagues.

Hot reliability topics for the workshop include: SiGe and strained Si, III-V, SOI, high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, organic electronics, emerging memory technologies (RRAM etc.) and future "nano"-technologies, NEMS/MEMS, photovoltaics, transistor reliability including hot carriers and NBTI/PBTI, Cu interconnects and low-k dielectrics, product reliability and burn-in strategy, impact of transistor degradation on circuit reliability, reliability modeling and simulation, optoelectronics, single event upsets, as well as the traditional topics of wafer level reliability (WLR) and built-in reliability (BIR).

征稿信息

重要日期

2017-07-10
摘要截稿日期

征稿范围

We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics:

  • Designing-in reliability (products, circuits, systems, processes)

  • Resistive memory: degradation mechanisms

  • Deep sub-micron transistor and circuit reliability

  • Customer product reliability requirements / manufacturer reliability tasks

  • Root cause defects, physical mechanisms, and simulations

  • Wafer level reliability tests, test approaches, and reliability test structures

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重要日期
  • 会议日期

    10月08日

    2017

    10月12日

    2017

  • 07月10日 2017

    摘要截稿日期

  • 10月12日 2017

    注册截止日期

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IEEE Electron Devices Society
IEEE Reliability Society
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