houping zhou / Wuhan Digital Engineering institute
A method of calibrating the integrated circuit ATE (Automatic Test Equipment) by synchronizing and measuring the signal on the DUT(Device Under Test) side while test is presented. This method connects the measuring instrument[1] to the pin of the DUT.Then the calibration software from the control computer receives the indication from the measuring instrument and the measurand[1] from the ATE. At last, the specifications of the ATE are calibrated via analyzing data from the measuring instrument and compare with the data from the ATE.