187 / 2019-05-08 10:53:34
A method of calibrating ATE while test
ATE, CALIBRATION,TEST
摘要录用
houping zhou / Wuhan Digital Engineering institute
A method of calibrating the integrated circuit ATE (Automatic Test Equipment) by synchronizing and measuring the signal on the DUT(Device Under Test) side while test is presented. This method connects the measuring instrument[1] to the pin of the DUT.Then the calibration software from the control computer receives the indication from the measuring instrument and the measurand[1] from the ATE. At last, the specifications of the ATE are calibrated via analyzing data from the measuring instrument and compare with the data from the ATE.
重要日期
  • 会议日期

    09月17日

    2019

    09月19日

    2019

  • 03月17日 2019

    初稿截稿日期

  • 04月30日 2019

    初稿录用通知日期

  • 05月31日 2019

    终稿截稿日期

  • 09月19日 2019

    注册截止日期

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