On-Orbit Degradation Analysis and Prediction of Spacecraft Thermal Control Coatings
编号:174 访问权限:仅限参会人 更新:2026-10-19 18:07:01 浏览:4次 口头报告

报告开始:暂无开始时间(Asia/Shanghai)

报告时间:暂无持续时间

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摘要
During on-orbit operation, thermal control coatings on spacecraft surfaces are exposed to space radiation, causing a gradual increase in solar absorptance and absorbed heat flux. To address this issue, this study investigates the radiation transfer mechanism, on-orbit sensor monitoring, and data-driven prediction of coating degradation. A Monte Carlo method is employed to analyze the radiative transfer characteristics of coatings at both mesoscopic and macroscopic scales. An on-orbit monitoring device was developed to acquire temperature telemetry data from eight types of coatings, including S781, over 31 months. Using these data, the solar absorptance degradation curve of S781 was obtained through inversion, showing good agreement with literature data. A sliding window-based dynamic parameter identification method is proposed to enable continuous tracking and adaptive updating of degradation rate coefficients. Validation using real on-orbit data demonstrates that the method can identify early-stage data-driven fitting variations and achieve stable fitting after adaptive refitting. This study demonstrates the feasibility of integrated sensing, measurement, and intelligent data analytics for on-orbit coating degradation monitoring.
关键词
thermal control coatings,radiation characterization,Monte Carlo method,prediction model,degradation analysis
报告人
Qineng Wang
Researcher Key Laboratory for Satellite Digitalization Technology, Innovation Academy for Microsatellites, Chinese Academy of Sciences

稿件作者
Liu Liu University of Chinese Academy of Sciences;Innovation Academy for Microsatellites, Chinese Academy of Sciences
Xiaofeng ZHANG University of Chinese Academy of Sciences;Innovation Academy for Microsatellites, Chinese Academy of Sciences
Qineng Wang Key Laboratory for Satellite Digitalization Technology, Innovation Academy for Microsatellites, Chinese Academy of Sciences
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重要日期
  • 会议日期

    11月06日

    2026

    至

    11月08日

    2026

  • 10月15日 2026

    初稿截稿日期

主办单位
IEEE Instrumentation and Measurement Society
承办单位
Sichuan University
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