Physics-Guided Data Augmentation for Sparse Degradation Samples of Auxiliary Power Units
编号:171 访问权限:仅限参会人 更新:2026-10-19 18:06:28 浏览:4次 口头报告

报告开始:暂无开始时间(Asia/Shanghai)

报告时间:暂无持续时间

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摘要
Remaining useful life (RUL) prediction of aircraft auxiliary power units (APUs) is often limited by sparse terminal degradation samples, because on-wing removal events are much fewer than routine monitoring records. Although A13 reports provide operating and performance observations during APU service, exhaust gas temperature (EGT) trajectories are discrete, noisy, and vary with load conditions, which limits the degradation information available for model training. To address this problem, this paper proposes a physics-guided data augmentation method for sparse APU degradation samples. EGT is first transformed into a degradation residual by removing the healthy baseline value. A multi-distribution fusion strategy is then used to generate residual trajectories by combining stable degradation trends with multiple perturbation components. Boundary, terminal-trend, and local-fluctuation constraints are incorporated to reduce unreasonable generated patterns. The generated residuals are reconstructed into EGT degradation trajectories and combined with original A13 parameters as augmented inputs for RUL prediction. Experiments on APU data show that the proposed method improves generated data quality and enhances RUL prediction under sparse terminal degradation samples.
关键词
Aircraft auxiliary power units; Remaining useful life prediction; Physics-guided; data augmentation
报告人
Yicong Duan
Student Harbin Institute of Technology;Zhengzhou Advanced Research Institute, Harbin Institute of Technology

稿件作者
Yicong Duan Harbin Institute of Technology;Zhengzhou Advanced Research Institute, Harbin Institute of Technology
Xuzhe Cheng Harbin Institute of Technology
Lulu Wang Shenyang Northern Aircraft Maintenance & Engineering Co., LTD
Shengwei Meng Harbin Institute of Technology
Datong Liu Harbin Institute of Technology
Yijun Sun Harbin Institute of Technology
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重要日期
  • 会议日期

    11月06日

    2026

    至

    11月08日

    2026

  • 10月15日 2026

    初稿截稿日期

主办单位
IEEE Instrumentation and Measurement Society
承办单位
Sichuan University
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