Advances in Material Characterization by Scanning Transmission Electron Microscopy Combined with Electron Energy Loss Spectroscopy
编号:170 访问权限:仅限参会人 更新:2026-10-19 18:06:18 浏览:4次 口头报告

报告开始:暂无开始时间(Asia/Shanghai)

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摘要
Scanning transmission electron microscopy combined with monochromated electron energy-loss spectroscopy (STEM-EELS) has matured into a comprehensive multi-dimensional characterization platform that simultaneously maps atomic-scale structure, elemental distribution, valence states, and phonon dispersions. This review systematically examines the physical foundations and data-analysis strategies of STEM-EELS, highlighting three illustrative application domains: (i) catalytic interfaces, (ii) battery materials and (iii) quantum materials. We further address the synergy between 4D-STEM and EELS, which correlates crystallographic distortions with electronic fine-structure variations. We conclude by outlining future pathways: sub-meV energy resolution for magnon detection, liquid-helium stages for quantum-ground-state visualization, and real-time machine-learning-assisted spectral decomposition.
关键词
Scanning transmission electron microscopy; Electron energy loss spectroscopy; Catalysis; Energy materials; Quantum materials
报告人
Zijie Yu
Student Shanghai Institute of Technology

稿件作者
Zijie Yu Shanghai Institute of Technology
Xiaohan Hou Xi'an Jiaotong University
Sichao Zhang Xi’an Jiaotong University
Yu Chen Xi'an Jiaotong University
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重要日期
  • 会议日期

    11月06日

    2026

    至

    11月08日

    2026

  • 10月15日 2026

    初稿截稿日期

主办单位
IEEE Instrumentation and Measurement Society
承办单位
Sichuan University
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