Negative sample bias is commonly applied in ultraviolet photoelectron spectroscopy (UPS) to facilitate the detection of low-energy electrons, but its influence on the measured secondary-electron cutoff requires careful assessment. This study investigates Au spectra acquired using He I radiation at sample biases of grounded, −2, −5, −8, and −10 V. Each spectrum was referenced to the midpoint of its Fermi edge, and the cutoff was determined from the intersection of a linear fit to the rising edge and the background. Negative bias shifted the spectra toward higher kinetic energies, increased the recorded intensity near the cutoff, and suppressed a weak shoulder observed under grounded conditions. The apparent work function decreased from 4.91 eV at ground to 4.54–4.44 eV under negative bias, with similar values at −8 and −10 V. These observations are consistent with improved collection of low-energy electrons, while the remaining variation in cutoff position after Fermi-edge alignment indicates that bias correction alone does not ensure measurement consistency. The results emphasize the importance of evaluating both onset shape and cutoff stability across bias conditions rather than assuming that a larger negative bias improves measurement accuracy.