报告详情
Simulation of Electronic Energy Levels in Cu2O Based on Combined Ultraviolet Photoelectron Spectroscopy Analysis
编号：134
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更新：2026-10-14 23:48:42 浏览：5次
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报告时间：暂无持续时间
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摘要
Accurate characterization of the electronic structure near the valence-band edge is essential for understanding carrier transport in oxide semiconductors. However, the mobility edge of Cu2O is difficult to identify using conventional ultraviolet photoelectron spectroscopy (UPS) alone. In this work, a combined ultraviolet photoelectron spectroscopy analysis framework integrating photoelectron yield spectroscopy (PYS), UPS, constant-final-state UPS (CFS-UPS), and constant-initial-state UPS (CIS-UPS) is developed for electronic-level characterization and mobility-edge identification in Cu2O. A double-Gaussian density-of-states model is established to separate main valence band states and localized band tail states, while weighting functions are introduced to distinguish localized and extended electronic states. For CIS-UPS analysis, a weighted joint criterion combining slope variations between low- and high-energy regions with peak-shape variations induced by localized tail states is proposed. The results show that the combined spectroscopic approach improves the resolution of subtle electronic structures near the valence-band edge. The mobility edge of Cu2O is identified near the valence-band maximum, approximately 0.1 eV below the Fermi level, in good agreement with the model reference value. The proposed method provides a more objective and stable approach for mobility-edge identification than conventional single-spectrum analysis.
关键词
Ultraviolet Photoelectron Spectroscopy,Cuprous Oxide,Valence-Band Structure
报告人
Jingyi Liu
None Xi'an Jiaotong University稿件作者
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重要日期
-
会议日期
11月06日
2026
至11月08日
2026
-
10月15日 2026
初稿截稿日期
主办单位
IEEE Instrumentation and Measurement Society
承办单位
Sichuan University
联系方式
- Icsmd
- ic******@163.com
历届会议
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2026年11月13日 中国 Chengdu
2026 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD) -
2025年11月21日 中国 Guangzhou
2025 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence -
2023年11月02日 中国 China
International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence -
2023年11月02日 中国 Xi'an
2023 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence -
2022年11月30日 中国 Harbin
International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence -
2021年10月21日 中国 Nanjing
2021 International Conference on Sensing, Measurement and Data Analytics in the era of Artificial Intelligence -
2020年10月15日 中国 Xi'an
International Conference on Sensing, Measurement and Data Analytics in the era of Artificial Intelligence
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