报告详情
Advanced TRL Method for Differential Devices
编号：32
访问权限：仅限参会人
更新：2025-11-19 09:19:54 浏览：189次
拓展类型1
摘要
Accurate calibration of Vector Network Analyzers (VNAs) remains a keystone for high-reliability characterization of RF and microwave devices, especially when dealing with embedded differential structures. This paper presents an advanced TRL (Thru-Reflect-Line) calibration technique precisely designed for devices with differential input and single-ended output integrated into measurement boards. The proposed method builds upon a previously introduced TRL framework tailored for two-port devices and extends its applicability to asymmetric three-port configurations using simulated or on-wafer characterized standards. Through a three-step calibration process involving sequential TRL setups and an impedance bridging scheme, all elements of the Z-parameter matrix—including the otherwise inaccessible Z21—are successfully extracted. Comprehensive simulations using Agilent ADS validate the effectiveness and robustness of the proposed technique. The outcomes confirm that this approach provides a scalable and accurate methodology for embedded system characterization, especially in scenarios where conventional calibration kits fall short due to size and layout constraints.
关键词
Calibration,TRL,Differential,Test board,DUT
报告人
Ali Rachini
Assistant Professor Holy Spirit University of Kaslik稿件作者
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重要日期
-
会议日期
12月29日
2025
至12月31日
2025
-
12月30日 2025
报告提交截止日期
-
02月10日 2026
初稿截稿日期
-
02月10日 2026
注册截止日期
主办单位
国际科学联合会
承办单位
扎尔卡大学
联系方式
- Miss AsianComNet
- as******@usssociety.org
历届会议
-
2024年10月24日 泰国 Bangkok
2024亚洲通讯与网络会议
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