Evaluating Wire Insulation Performance in Aeronautical Electrical Equipment at Elevated Temperatures
编号:152 访问权限:仅限参会人 更新:2025-12-23 13:21:18 浏览:107次 拓展类型2

报告开始:2025年12月30日 10:45(Asia/Amman)

报告时间:15min

所在会场:[S8] Special Track 2 : Underwater Technologies Special Track 3: Green Energy Breakthroughs and Sustainable Energy Technologies [S8-1] Special Track 2 : Underwater TechnologiesSpecial Track 3: Green Energy Breakthroughs and Sustainable Energy Technologies

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摘要
In aviation uses, particularly under high-temperature running circumstances, the performance and dependability of wire insulation are very crucial. Maintaining system safety and operational effectiveness in harsh flying conditions depends on long-term insulation integrity being maintained. But conventional assessment techniques may lack the accuracy to replicate continuous thermal stress and fail to identify early-stage insulation breakdown, thereby maybe resulting in system failures. This paper presents the Accelerated Aging and Dielectric Strength Testing (AA-DST) paradigm to go beyond these constraints. This approach more precisely and effectively evaluates insulation durability by combining high-temperature accelerated aging with thorough dielectric strength research. The AA-DST framework simulates real-world aeronautical thermal conditions, enabling a proactive evaluation of insulation breakdown thresholds. The proposed method is applied to a variety of wire insulation materials commonly used in aircraft electrical systems. By subjecting them to elevated temperatures and controlled stress conditions, the AA-DST framework identifies degradation trends and quantifies dielectric strength over time. Findings reveal that AA-DST provides enhanced predictive insights into insulation failure mechanisms, enabling improved material selection and design strategies. This contributes to safer, more reliable electrical systems in aerospace engineering. The proposed method achieves the predictive insights by 97.4%, reliability by 95.8%, material selection by 98.7%.
关键词
Wire Insulation, Elevated Temperature, Dielectric Strength, Accelerated Aging, Aeronautical Systems, Insulation Reliability
报告人
Udita Goyal
Professor Quantum University Research Center; Quantum University

稿件作者
Udita Goyal Quantum University Research Center; Quantum University
Guntaj J Chitkara University
Sidhant Das Chitkara University
Ravivarman G Karpagam Academy of Higher Education
Jeevananthan P Karpagam College of Engineering
Varalakshmi S JAIN (Deemed to be University)
Zakaria Che Muda Malaysia;Faculty of Engineering and Quantity Surveying INTI-IU University Nilai
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重要日期
  • 会议日期

    12月29日

    2025

    12月31日

    2025

  • 12月30日 2025

    报告提交截止日期

  • 02月10日 2026

    初稿截稿日期

  • 02月10日 2026

    注册截止日期

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