This study addresses the need for accurate validation of accelerated degradation models, with a focus on the Wiener-Arrhenius model. Accelerated degradation testing (ADT) is widely used in modern engineering to predict the reliability and lifespan of products under accelerated stress conditions. However, current models often lack empirical validation. The research proposes a robust methodology for validating the Wiener-Arrhenius accelerated degradation model through statistical hypothesis testing and area ratio analysis. The results from an ADT case using carbon-film resistors demonstrate that the Wiener-Arrhenius model provides reliable predictions for component degradation under different stress levels. Additionally, Monte Carlo simulations were employed to evaluate the model's reliability, confirming its accuracy in predicting failure times. The findings emphasize the importance of systematic validation in ensuring the applicability of accelerated degradation models for product lifespan assessments.

Accelerated degradation model