Reliability Enhanced Architecture of Compact Advanced Encryption Standard (AES) Processors
编号:70 访问权限:仅限参会人 更新:2021-12-06 19:12:53 浏览:188次 口头报告

报告开始:2021年12月12日 10:45(Asia/Shanghai)

报告时间:15min

所在会场:[S1] 论文报告会场1 [S1.3] Session 3: 热点领域安全

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摘要
Advanced Encryption Standard(AES) is one of the most popular cryptographic algorithms today, hardware AES architecture is widely used and usually implemented in CMOS technology. However, the downscaling of CMOS technology leads the hardware implemented AES to suffer from low reliability due to permanent faults (PFs) and transient faults (TFs). This paper investigates a reliable architecture for compact ASIC implemented Advanced Encryption Standard processors. We propose a reliability enhanced technique based on the inherent and temporal redundancy. By merging this technique with hardware redundancy schemes, the hybrid architecture can cope with both transient and permanent faults with a low area overhead. Results obtained with 65nm show a good trade-off of the hybrid solution between reliability improvement and area cost.
关键词
Fault Tolerance; Advanced Encryption Standard (AES); Triple Modular Redundancy(TMR); Dynamic Hardware Redundancy(DHR)
报告人
MaYiming
Southeast University; Universit´e Paris-Saclay

稿件作者
MaYiming Southeast University; Universit´e Paris-Saclay
CaiHao Southeast University
NavinerLirida Département Communications et Électronique
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重要日期
  • 会议日期

    12月11日

    2021

    12月12日

    2021

  • 08月18日 2021

    注册截止日期

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