Microwave Reflectometer for Density Measurement on J-TEXT Tokamak
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报告开始:2020年11月04日 11:00(Asia/Shanghai)

报告时间:15min

所在会场:[F] High Magnetic Field Engineering and Fusion Technology [F1] Session 29

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摘要
Microwave reflectometer is an essential diagnostic tool with high spatial and temporal resolution for the measurement of plasma density profile. In recent years, a microwave reflectometry system has been developed and optimized on the J-TEXT tokamak. It consists of three parts: Q band (33-50GHz) with extra-ordinary mode (X-mode), V band (50-75GHz) with X mode and Q band with ordinary mode (O-mode). Its measurement range covers from the edge to core of the low field side plasma. To obtain a linear frequency sweep, the dynamic calibration of the voltage control oscillator (VCO) is completed. The profile measured by the reflectometer is in good agreement with the result of the polarimetry.
关键词
microwave reflectometer,dynamic calibration,density profile
报告人
Xiehang Ren
Huazhong University of Science and Technology

稿件作者
Xiehang Ren Huazhong University of Science and Technology
Zhoujun Yang Huazhong University of Science and Technology
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重要日期
  • 会议日期

    11月02日

    2020

    11月04日

    2020

  • 10月27日 2020

    初稿截稿日期

  • 11月03日 2020

    报告提交截止日期

  • 11月04日 2020

    注册截止日期

  • 11月17日 2020

    终稿截稿日期

主办单位
IEEE IAS Student Chapter of Huazhong University of Science and Technology (HUST)
承办单位
Huazhong University of Science and Technology
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