87 / 2020-04-19 07:50:23
Numerical Study of the VDMOS with an Integrated High-K Gate Dielectric and High-K Dielectric Trench
high-k gate dielectric,VDMOS,transconductance,breakdown voltage,specific on-resistance
终稿
Guo yufeng / Nanjing University of Posts and Telecommunications
Zhang zhenyu / Nanjing University of Posts and Telecommunications
The VDMOS with an integrated high-k gate dielectric and high-k dielectric trench is investigated in this paper. The high-k (HK) dielectric is applied both for the gate dielectric and trench, which improves the performance without increasing the process complexity. First, HK dielectric trench makes the electric field distribution of the drift region more uniform, thus improving breakdown voltage (BV). Second, the HK dielectric trench assists the depletion of the drift region, thereby increasing the doping concentration of the drift region and decreasing the specific on-resistance (Ron,sp). Third, the HK gate dielectric decreases the threshold voltage (Vth) and increases the transconductance (gm) of the device. Simulation results show that the new VDMOS has a better breakdown, output, and conduction characteristics when compared to the sidewall HK dielectric VDMOS and conventional VDMOS.
重要日期
  • 会议日期

    07月10日

    2021

    07月12日

    2021

  • 05月10日 2021

    初稿截稿日期

  • 07月06日 2021

    注册截止日期

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