Reconfigurable field-effect transistor (RFET) has attracted great attention which can offer both n- and p- type devices. In this work, temperature characteristic of the RFET is investigated comprehensively, in comparison with tunnel field-effect transistor (TFET). By means of TCAD simulations, the RFET shows a lower subthreshold swing and higher Ion/Ioff ratio over a wide temperature range. To further explore the applications of the RFET, an XNOR operation is obtained through a single RFET. Finally, the impact of temperature on the XNOR is also studied and discussed.