135 / 2019-01-24 21:11:28
Indium tin oxide thin films prepared by dc magnetron sputtering for transparent heating
ITO, Dc sputter, Transparent, Conducting
摘要录用
Jianhua Li / National Institute of Metrology
Xueshen Wang / National Institute of Metrology
Pingwei Lin / National Institute of Metrology
XInhua Chen / Beijing University of Civil Engineering and Architecture
Longfa Zhang / Beijing University of Civil Engineering and Architecture
Shuo Liu / Beijing University of Civil Engineering and Architecture
This paper reported a research on conducting tin-doped indium oxide (ITO) films fabricated by dc magnetron sputtering for transparent heating. ITO films with a thickness of 130 nm were deposited on BF33 glass substrates, followed by an annealing process in N2 atmosphere for 2 h at 450 ℃. The crystal structure, surface morphology, optical and electrical properties of ITO films were characterized. The predominant crystal face orientation was (222). The transmittance from 400 nm to 800 nm was 92.5%. Results showed that the sheet resistance and resistivity increased but the temperature coefficient of resistance (TCR) decreased with the larger oxygen flow. A low TCR and proper resistivity were the key factors for the application of conducting transparent heating.
重要日期
  • 会议日期

    09月17日

    2019

    09月19日

    2019

  • 03月17日 2019

    初稿截稿日期

  • 04月30日 2019

    初稿录用通知日期

  • 05月31日 2019

    终稿截稿日期

  • 09月19日 2019

    注册截止日期

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