活动简介

The 2018 IEEE Nuclear and Space Radiation Effects Conference will be held July 16 - 20 at the Hilton Waikola, Kona, Hawaii. The conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short Course on radiation effects offered on July 16, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions.

Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged.

征稿信息

重要日期

2018-02-02
摘要截稿日期
2018-03-12
初稿录用日期
2018-07-13
终稿截稿日期

We are soliciting papers describing significant new findings in the following or related areas:
 
Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

  • Single-Event Charge Collection Phenomena and Mechanisms
  • Radiation Transport, Energy Deposition and Dosimetry
  • Ionizing Radiation Effects
  • Materials and Device Effects
  • Displacement Damage
  • Processing-Induced Radiation Effects

 
Radiation Effects on Electronic and Photonic Devices, Circuits and Systems

  • Single-Event Effects
  • MOS, Bipolar and Advanced Technologies
  • Isolation Technologies, such as SOI and SOS
  • Optoelectronic and Optical Devices and Systems
  • Methods for Hardened Design and Manufacturing
  • Modeling of Devices, Circuits and Systems
  • Cryogenic or High Temperature Effects
  • Novel Device Structures, such as MEMs and Nanotechnologies
  • Techniques for Hardening Circuits and Systems

 
Space, Atmospheric, and Terrestrial Radiation Effects 

  • Characterization and Modeling of Radiation Environments
  • Space Weather Events and Effects
  • Spacecraft Charging
  • Predicting and Verifying Soft Error Rates (SER)

 
Hardness Assurance Technology and Testing

  • New Testing Techniques, Guidelines and Hardness Assurance Methodology
  • Unique Radiation Exposure Facilities or Novel Instrumentation Methods
  • Dosimetry

 
New Developments of Interest to the Radiation Effects Community

作者指南

Papers accepted for oral or poster presentation at the technical program are expected to be submitted for publication in the IEEE Transactions on Nuclear Science (January 2019). Selection for this issue will be based on a separate submission of a complete paper. These papers will be subject to the standard full peer review given all papers submitted to the IEEE Transactions on Nuclear Science. Further information will be sent to prospective authors upon acceptance of their NSREC summary. It is not necessary to be an IEEE member to present a paper or attend the NSREC. However, we encourage IEEE and NPSS membership of all NSREC participants.

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重要日期
  • 会议日期

    07月16日

    2018

    07月20日

    2018

  • 02月02日 2018

    摘要截稿日期

  • 03月12日 2018

    初稿录用通知日期

  • 07月13日 2018

    终稿截稿日期

  • 07月20日 2018

    注册截止日期

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